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AMON

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IEEE

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PHI

XPS Microscope
xps
- Scanning x-ray source
- Sample introduction chamber
- Argon sputter ion gun
- Electron energy analyzer
- Optical microscope
- Five axis automated sample manipulator
- Optional UHV sample preparation chambers
- Optional C60 sputter ion gun
- Optional UV light source for UPS
- Optional dual anode x-ray source
- Optional electron gun for AES