- High speed and high precision vertical goniometer for various application
- Independent dual axis θ-2θ linkage drive, independent 2θ axis and θ axis drives are selectable
- High-precision angle reproducibility ( 0.0010 )
- Rotational sample stage
- Powder and bulk samples measurements between 1.50 -1650 on 2θ
- Thin films samples measurements by grazing incidence method (grazing incidence angle between 0.5-50)
Applications:
- Qualitative analysis: identification of crystalline phases
- Precise quantitative analysis by Rietveld method (Fundamental Parameters Approach)
- Crystallite size/lattice microstrain calculation
- Degree of crystallinity calculation and determination of amorphous content
- Overlapping peak separation
- Sample introduction chamber
- Argon sputter ion gun
- Electron energy analyzer
- Optical microscope
- Five axis automated sample manipulator
- Optional UHV sample preparation chambers
- Optional C60 sputter ion gun
- Optional UV light source for UPS
- Optional dual anode x-ray source
- Optional electron gun for AES