X-ray Diffractometer
Technical specifications:
- High speed and high precision vertical goniometer for various application
- Independent dual axis θ-2θ linkage drive, independent 2θ axis and θ axis drives are selectable
- High-precision angle reproducibility ( 0.0010 )
- Rotational sample stage
- Powder and bulk samples measurements between 1.50 -1650 on 2θ
- Thin films samples measurements by grazing incidence method (grazing incidence angle between 0.5-50)

- Qualitative analysis: identification of crystalline phases
- Precise quantitative analysis by Rietveld method (Fundamental Parameters Approach)
- Crystallite size/lattice microstrain calculation
- Degree of crystallinity calculation and determination of amorphous content
- Overlapping peak separation