Surface Science Laboratory


  • XPS

    - Scanning x-ray source
    - Sample introduction chamber
    - Argon sputter ion gun
    - Electron energy analyzer
    - Optical microscope
    - Five axis automated sample manipulator
    - Optional UHV sample preparation chambers
    - Optional C60 sputter ion gun
    - Optional UV light source for UPS
    - Optional dual anode x-ray source
    - Optional electron gun for AES
(funded by AMON and ARHEOINVEST Interdisciplinary Platforms)

  • Shimadzu LabX XRD 6000 Diffractometer

    Technical specifications:
    - High speed and high precision vertical goniometer for various application
    - Independent dual axis θ-2θ linkage drive, independent 2θ axis and θ axis drives are selectable
    - High-precision angle reproducibility ( 0.0010 )
    - Rotational sample stage
    - Powder and bulk samples measurements between 1.50 -1650 on 2θ
    - Thin films samples measurements by grazing incidence method (grazing incidence angle between 0.5-50)

    - Qualitative analysis: identification of crystalline phases
    - Precise quantitative analysis by Rietveld method (Fundamental Parameters Approach)
    - Crystallite size/lattice microstrain calculation
    - Degree of crystallinity calculation and determination of amorphous content
    - Overlapping peak separation


(funded by AMON Interdisciplinary Platform)

• High-precision angle reproducibility ( 0.001o )• High-precision angle reproducibility ( 0.001o )
MODx - Mollio